Scan Executive Diagnosis
The Scan Executive Manufacturing Test Station provides a robust set of diagnostic capabilities to enable manufacturing personnel to isolate and correct problems inadvertently introduced during the PCB assembly process. The Scan Executive Manufacturing Test Station is unique in the industry as it provides the same diagnostic capabilities found in the Eclipse Test Development Environment as standard features. Many 1149.1 tool vendors do not provide diagnostic capabilities in their standard product offerings and force users to purchase a separate package to diagnose failures. Not having diagnostic capabilities in the manufacturing environment is costly and should be a consideration when purchasing an 1149.1 test solution.
Scan Path Diagnostics
The EclipseTM Scan Path Integrity Test (or SPIT) automatically verifies that all of a design's test logic is functioning properly. Scan Executive will return pin-level diagnostics for each SPIT failure so that the test logic can be debugged, repaired and production test can begin.
Status Window Displaying a Fault During SPIT
- SPIT pinpoints the error between two devices on a board
For each failure, the Scan Executive Manufacturing Test Station will display the PinFault Diagnostics list, which includes, the device name and pin where the failure was observed.
Status Window Displaying PinFaults
Customized Diagnostic Actions
The Scan Executive manufacturing Test Station can direct status and diagnostic messages generated during a test to one or more outputs. The default output for diagnostic information is the Scan Executive Manufacturing Test Station's status window. Diagnostics can also be directed to a file, printer or database. Scan Executive builds customized reports based on the UUT Serial number and LOT type, allowing units to be tracked through their entire life cycle.
Boundary-Scan Intelligent Diagnostics (BSID)
Optionally, the Scan Executive Manufacturing Test Station can include support for BSID. BSID is an advanced form of diagnostics that uses the failure data generated by the Eclipse Board Interconnect Test ATPG engine to isolate the failing devices.
Status Window Displaying a Short Fault