Scan ExecutiveT is a
Flexible and Easy-to-Use Production Test Environment for
Scan Executive Manufacturing Test
Station is a software platform that enables production
personnel to execute test programs in a manufacturing
environment using a variety of cost-effective IEEE 1149.1 test
hardware solutions. Using Scan Executive supervisors,
technicians and operators can easily apply test and device
configuration suites, program FLASH memories in-system without
in-depth knowledge of IEEE 1149.1.
Scan Executive has been designed so that tests developed using the EclipseTM
Test Development Environment - Scan Path Integrity Test (SPIT),
Board Interconnect Test (BIT) and Virtual Component Cluster Test
(VCCT) can be seamlessly applied to a Unit Under Test (UUT) in
predefined flows that are controlled with Scan Executive's Scripting
"High quality board and system test, and effective board and system debug, are essential in ensuring the reliability and availability of Sun Microsystem's products. Intellitech's Eclipse and scan-based test is critical to meeting this goal. Sun has used, and is continuing to use, Eclipse on products ranging from processor modules to Enterprise servers. We have found Eclipse from Intellitech to be a flexible, cost effective test solution, which is deployed throughout Sun Microsystems as a part of Sun's test process."
Manager DFT Technology
Scan Executive Test Application
Scan Executive applies test data to a Unit Under Test (UUT) based on the information contained in a single (.tst) file. The test engineer creates this .tst file in advance and supplies it with information such as the location and name of the Eclipse database, DUT options file, and Scan Executive Scripting Language (SSL) file(s) and optionally, any debug files for using Visual Fault AnalyzerTM (VFATM) and Schematic Logic ProbeTM (SLPTM).
Scan Executive GUI Increases the Throughput and Efficiency of the Manufacturing test Process
The Scan Executive GUI enables operators to apply tests in a controlled and uniform manner. The Scan Executive graphical user interface contains pre-programmed buttons for commonly used commands to load and run tests, setup the DUT, configure the test controller and debug failures. These facilities permit operators and technicians to uniformly apply tests and resolve failures with a single mouse click using the same utilities that were used during test development.
At the conclusion of a test, the Scan Executive Test Status Window will display the UUT's serial number, its lot type, the begin/end time of the test as well as diagnostic output. Diagnostics are presented in the standard Eclipse Pinfault diagnostic format, which displays failures to the device pin level for each Serial Vector Format (SVF) file that has been applied to the UUT. In addition, all Scan Executive output could be directed to a file or printer.
Intellitech's Integrated Test Flow
Design Engineers use the Eclipse Test Development Environment to create, debug and validate their in-system CPLD, FPGA and FLASH configuration and programming suites. Test Engineers use the Eclipse Board Interconnect Test (BIT) ATPG engine to automatically generate 100% pin-level fault coverage for IC-to-IC and IC-to Memory interconnects. Both design and test engineers can resolve problems using one of the Eclipse debug utilities -- Eclipse Spreadsheet Window, the Eclipse Timing Diagram Analyzer, Schematic Logic Probe or Visual Fault Analyzer. Once the configuration and test suites have been validated, they are passed to the Scan Executive Manufacturing Test Station for execution.
Scan Executive Requirements
Scan Executive software is available for Microsoft Windows 98, Windows Millennium, Windows NT 4.0, Windows 2000, and Sun Solaris 8 (SunOS 5.8). Scan Executive can be licensed as node locked or floating and uses Globetrotter FLEXlm software.
Scan Executive Manufacturing Test Station Feature Set
- Intuitive GUI simplifies the application of test data in high-volume manufacturing flows
- Scan Executive's scripting language SSL lowers the cost of test development by eliminating the need of C++ development
- Scan Executive supports numerous hardware test application alternatives
- Multiple executing modes prevent unintentional test setup and program changes
- Optionally debug test failures in production using SLP and VFA
- Administrative login mode to control user program privileges allows supervisors to maximize productivity.
- User Level sensitive scripting allows
test engineers to write scripts that display information
appropriate to the experience of user