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Silicon Debug with IJTAG and NEBULA includes Synopsys' TetraMAX ATPG support

Silicon Debug using Network Based Platform Provides Simplified Flow From ATPG to Desktop DFT Validation, Silicon Debug and Diagnosis

DURHAM, N.H.--(BUSINESS WIRE)--Sept. 8, 2003--Intellitech Corporation, the technology leader in scan-based configuration, debug and test solutions today announced the availability of the NEBULA Silicon Debugger(TM). The NEBULA speeds test vector debug time from weeks to less than a half of a day through its direct knowledge of on chip Design-for-Test structures and integrated use of Synopsys TetraMAX(R) ATPG patterns and diagnostics. The NEBULA enables remote testing of prototype silicon for stuck-at faults, path-delay faults, at-speed BIST and in-situ functional debug. Failures can be quickly isolated to the gate and net level with the integrated access to the TetraMAX fault-simulation database for lookup of ATPG faults. The NEBULA acronym is loosely translated as Network Based debug and Logic Analysis since the debug and validation platform is remotely accessible by design and test engineers over a wide area network.
    With increased circuit complexity and advanced packaging (at boththe chip and system levels) silicon debug has become more difficult and more time consuming. Physical access and visibility into the design during debug is significantly reduced, making traditional unstructured debug methods less productive. A recent study by Gartner Dataquest indicates that the design time of a large ASIC takes between nine and 12 months. In the same study, it was shown that the typical silicon debug time is about two-thirds that. While it has always been obvious to try to shrink the design cycle to achieve time-to-volume gains, it has been less obvious that similar gains in time-to-volume can be achieved by shrinking the silicon debug times.
    "Silicon debug continues to be a growing segment of the test and validation market," said CJ Clark, Intellitech's chief executive officer. "We helped pioneer silicon debug back in 1996 with our first generation product, the RCT platform. NEBULA will help designers to meet critical time-to-volume windows by enabling early structural
test, vector validation, IC characterization, gate level failure analysis, in addition to enabling full-speed functional debug."    Key to shortening the silicon debug cycle is the 'smart tester' architecture of NEBULA. It understands the difference between serial scan test data and parallel pin test data allowing the engineer to debug using functional elements of the design rather than counting 'bits' from tester channel results. The architecture and scripting language enables complex decision-making during execution of test programs that is not possible with memory-behind-pin tester architectures. For instance, NEBULA can apply test patterns and based on the failure that occurs, program an on-chip non-volatile memory with data to disable the faulty area and enable a redundant logic area. The NEBULA platform also understands the DFT infrastructure inserted by Synopsys tools, which is a departure from traditional memory-behind-pin DFT focused platforms and 'big iron' ATE. The NEBULA Silicon Debugger takes advantage of the DFT infrastructures such as internal muxed flip-flop scan, IEEE 1149.1 or LSSD inserted by Synopsys DFT Compiler and BSD Compiler. The direct knowledge of the test structures inserted by these DFT tools plus an understanding of how to interpret the ATPG patterns generated by TetraMAX reduces many of the variables confronting the engineer during first silicon debug. The NEBULA also incorporates a special "Test Diagnostics Server" which enables bidirectional communication with a user's TetraMAX diagnostics license. This enables gate and net level diagnostics for TetraMAX based tests running on remote NEBULAs and windows based PCs. NEBULA is the result of Intellitech's membership in Synopsys' in-Sync(R) interoperability program, through which Synopsys works with tool providers to maximize the productivity of mutual customers.

    In-situ Debug

    The NEBULA Silicon Debugger interfaces to an IC using standard test protocols, such as muxed scan, LSSD (Level Sensitive Scan Design) or IEEE Std. 1149.1. The NEBULA Silicon Debugger uses a very low pin count access method that enables in-situ access to prototype silicon, that is, the IC can be on a PCB or in the system while debug is performed. Even though test patterns are developed for production tests with full pin contact, NEBULA will interpret and exercise the patterns differently for the in-situ environment without vector translation. In-situ debug is especially useful since custom DUT cards are not needed, and debug can be performed on early FCS and prototype parts without the removal of the silicon from the PCB. This is a major departure from traditional low-cost DFT focused debug platforms, which require full pin access and cannot support the re-use of test patterns and debug scripts throughout the design hierarchy. Time and development costs can be reduced since design engineers can re-use test patterns and scripts in various different debug and validation environments.
    The NEBULA Silicon Debugger platform provides built-in softwaresupport for external instruments, such as power supplies, frequency generators, RF signal generators and thermal chambers, that are needed for test, debug and characterization. Industry standard instrumentation, such as PXI, VXI and GPIB instruments, are readily supported through the VISA (Virtual Instrumentation Software Architecture) and IEEE-488 Instrument interfaces. These instruments can be controlled with the built-in capabilities of NEBULA, which provide scripting and interactive GUIs, or alternately through user defined scripts and GUIs. VISA support provides an 'open architecture' for users to add instruments and digital I/O as they need. It enables the NEBULA Silicon Debugger platform to provide broad plug and play capabilities, allowing design and test engineers to develop interoperable, multi-vendor, solutions that are reusable from project to project. More information can be found at http://www.intellitech.com/products/silicondebug.asp

    Pricing and Availability

    The NEBULA Silicon Debugger is available now from stock, starting at approximately $50K for desktop hardware and a floating license. Contact Intellitech at http://www.intellitech.com for various options.

    Intellitech is a registered trademark of Intellitech Corp. NEBULA Silicon Debugger is a trademark of Intellitech Corp. Synopsys, TetraMAX and in-Sync are registered trademarks of Synopsys, Inc. DFT Compiler is a trademark of Synopsys, Inc. All other trademarks or registered trademarks mentioned in this release are the intellectual property of their respective owners.

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    CONTACT: Intellitech Corporation
             Kareen Lefoley, 603-868-7116 x106