BIST expert joins Intellitech Corporation as Chief Technology Officer
DURHAM, NH - September 13, 1999 - Intellitech Corporation, the technology leader in scan-based debug and test systems, announced today that Michael Ricchetti has joined the company as the Chief Technology Officer (CTO).
Mr. Ricchetti is well known in the test industry for his expertise in BIST and Design-for-Test implementation and methodology. His areas of expertise also include Boundary Scan and embedded core test. Prior to joining Intellitech, Mr. Ricchetti was a Senior Staff Methodology Consultant with Synopsys, Inc. While at Synopsys he focused on Design-for-Test (DFT), BIST and System on Chip (SoC) Test methodologies. His work there included test consulting and definition & architecture of SoC test solutions and tools. "We are very pleased to have someone with Mike's strong DFT background as our CTO. His expertise will help us continue to provide state-of-the-art tools for scan-based electronic design verification and silicon debug", said, CJ Clark, Intellitech President and CEO.
Previously, he has been with several high-tech companies, including Sunrise, Cadence, Hewlett-Packard, and Apollo Computers. Mike has over 17 years of experience in Design for Testability and has authored many papers in the area of Design for Test. He earned a BS degree in Computer Engineering at the Ohio State University in 1982.
Mike is a member of the IEEE and is a working group member of both the IEEE 1149.1 Std. Boundary Scan and Test Access Port Standard and the proposed IEEE P1500 Embedded Core Test Standard. He is also an active member of the P1500 Scaleable Architecture Task Force. Mike will work in Intellitech's Durham, NH office.
Incorporated in 1988, Intellitech develops and markets scan-based diagnostic tools for IC/SOC silicon debug and PCB test. Intellitech customers include the industry leading OEM's of electronic products such as computers, workstations, network equipment, telecom, aviation and defense. Intellitech maintains it's technology leadership by actively participating in IEEE standards development for scan-based test standards such as IEEE Std. 1149.1, 1149.4, P1500 and P1532. Intellitech has sales and support offices located in Durham, NH and San Jose, CA.
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