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Boundary Scan JTAG

JTAG TAP
» UltraTAP Brochure

» Eclipse Family Overview » Test Development
» Manufacturing Test
» Diagnostics and Repair


UltraTAP JTAG/1149.1 Benefits

UltraTAP Intelligent Test Controller

  • Fastest throughput in the industry - 64 Mbits per second.  Shorter configuration and test times result in cost savings during development and production.
  • Works directly with all Intellitech TEST-IP products.  UltraTAP can deliver high-speed data across a multi-PCB system
  • Flexible and powerful feature set accommodates high-volume production or complex system debug
  • Integrated with the Eclipse Test Development Environment or the Scan ExecutiveTM Manufacturing Test Station
  • Cost-effective solution for engineering debug as well as for full production test
  • Small form factor - About the size of a pack of cigarettes