JTAG EMULATION TEST
JET TEST FUNCTIONAL TEST CONCURRENT TEST
USING MICROPIN VERTICAL
FIXTURES
Copyright © Intellitech Corp. 2009. All rights reserved.
Cost Compares well with traditional fixture
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Added functional test plug-ins
Increased fault coverage
Offline handling
- Less tester idle time
Could
zero with balanced testing
Maintenance off-line
-
Pins can be repaired while system in-use
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Less weight (1 person lift) for shell/rack
Not limited to depanelized PCBs or 3U height