JTAG EMULATION TEST
JET TEST FUNCTIONAL TEST CONCURRENT TEST
USING MICROPIN VERTICAL
FIXTURES
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3000 / 60 = 50 units per minute
Consider:
•Strategic change
mid-way: now need on-PCB flash programming
•Test time prediction
during proto – inaccurate
•Failures/Process
problems dictate more intensive tests
What happens if more test time is needed?
Are scalable fixtures the
answer?