N = Number of UUTs to
Test concurrently
TCP= Test and
Configuration time in concurrently
U = Handling Time to
Unload UUT from Tester
L = Handling Time to
Load UUT on Tester
TS = Time for tests & diagnostics
that
must occur
sequentially (if any)
CS = Time for configuration that must
occur
sequentially (if any)
Simplified:
N = Test Time / Handling
Time
Massively
concurrent test has less gain in overall
throughput
compared to balanced concurrent
Test.
Duel well
fixture on ICT only optimizes the
handling
time not the test time.