International Technology Roadmap for Semiconductors Adaptive Test Webinar 4/12/2010

International Technology Roadmap for Semiconductors (ITRS) Adaptive Test Webinar - 4/12/2010

Title: TI's Experience with Adaptive Test - Outlier Screening
· Outlier screening model
· Characterization of outlier screens
· Case studies for Quality improvement and Burn-in Reduction
Presenter: Amit Nahar, Texas Instruments
Date: 4/12/2010