Copyright © 2002 Intellitech Corp. All rights reserved.
Changes in System Test
Software
Functional
System
Test
Today – Ad-hoc/custom
embedded software for system
test dominates
System Test can learn from IC test, where structured DFT was developed to reduce test development time through ATPG.
Like cores in the IC, Systems need to have a test architecture that is scalable and enables test re-use of manufacturing PCB tests.
Fault coverage at the system level can be measured where structured stuck-at tests and structured at-speed tests are used.