•IEEE
1149.1 - Standard Test Access Port and Boundary-Scan
architecture is made of two parts
•
•Boundary-Scan
is good for ‘EXTEST’ and checking ‘stuck-at’ IC
interconnects
•
•Test-Access
Port is more important
•The
future will be more centered on ‘scan-based’ test, configuration
and debug
•
•IEEE
1532 In-System Configuration
•IEEE
1149.4 Mixed Signal Standard
•IEEE
P1500 Core based IC Test