Copyright © 2002 Intellitech Corp. All rights reserved.
The Future of Boundary Scan
OTW 2002
10/08/02
CJ Clark
Past Chair, IEEE 1149.1
CEO, Intellitech Corp.
The Technology Leader in
Scan-Based Debug and Test
The slide guide is available in the following file:
slidesV5.3.ppt:
PowerPoint 2000 format.
Viewable also
with PowerPoint ’97.