JTAG Scans around the IC








DFT - Boundary Scan Components for scan-based PCB design

Boundary Scan TEST-IPTM for 1149.1 test, Flash Programming & FPGA configuration

Boundary Scan starts with the TEST-IP family. Get your PCB scan design right with easy to use boundary scan components. The TEST-IP Family is patent-pending infrastructure Intellectual Property which enables design teams to produce high-quality self-testable and in-the-field re-configurable products based on 1149.1 test.

bound scanworks
JTAG Test & Flash Programming Tools

Boundary Scan test tools   - an overview of how the Eclipse family fits into your test and FLASH programming strategy using 1149.1 boundary scan.

The Eclipse Scan Test Development Environment is a complete solution for 1149.1 scan based testing, debug and in-system configuration of complex PCBs and Systems.    Reduce boundary scan interconnect test development from days to minutes with the automated Intellitech Board Interconnect Test. 1149.1 and non-1149.1 models included and extracted from your CAD data. Read how Intellitech's exclusive schematic based debug can lower your prototype debug and test development time.

Do you have a small PCB and think you can't afford an investment in Intellitech? Small PCB versions of Eclipse are more affordable than you think! Register to download evaluation copies and get online price lists. Why invest in low end boundary tools with limited capabilities when you can use high end tools scaled down for you in cost?

If you are an OEM, EMS or CM; the Scan Executive and the PT100 Parallel Tester can save test and capital equipment costs over 1149.1 on ICT.  The Award winning PT100 Parallel Tester  can test PCBs and program FLASH on-board within production cycle times.  Test and Program 10, 100 or more PCBs in order to increase throughput.

1149.1 tests not enough?  It's easy to integrate CPU-based tests, LabView and National Instruments based measurements with the Eclipse family. The PXI Based JTAG Manufacturing Test Station is a Flexible and Easy-to-Use Production Test Application Environment for Complex PCBs.  

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New Strategies for cost effective production PCB test and configuration"

并行可编程ICT平台提升板上闪存及FLASH器件测试效率

More News

"In our market, system cost is an important factor in our customer's decision process. Xalted selected Intellitech's SystemBIST and Concurrent JTAG Architecture in order to lower our FPGA configuration and system test costs."

Robert D. Connolly V.P. Product Engineering Xalted Networks (India)

"We surveyed the three major players in the PC based 1149.1 test market and after an objective comparison of the tools, Intellitech's Eclipse had the “ease-of-use” features we needed for prototype and production test. The Schematic Logic Probe and Visual Fault Analyzer provide a design and physical topography necessary for locating and debugging faults.
Alex Brook
Manager
New Products Technology
Teradyne