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May 8th , 2013 .Intellitech presents on new standardized Electronic Chip ID in 1149.1-2013 that prevents IC cloning and counterfeiting at IEEE Atlantic Test Workshop 2013. IC Anti-Counterfeiting April 29th , 2013 Intellitech CEO, CJ Clark, receives two awards at IEEE VLSI Test Symposium 2013. Best Tutorial and IEEE TTTC Award February 7th, 2013 The IEEE-SA Standards Board has approved the P1149.1-2013 standard. Published standard to be available in May 2013. January 24th, 2013 A short tutorial on the basics of P1149.1-2013 and the operation of on-chip instruments via BSDL and PDL is provided here. 1149.1-2013 IJTAG Basics January 23rd, 2013 IEEE 1149.1-2013 was approved by Revcom today. Next step is IEEE Board approval and publishing of the standard.
“I like the fact that Intellitech has good overall long
term vision for IEEE 1149.x based test. They are not just reacting
to what I need at the moment....Support has been one of the best
I’ve ever encountered from a vendor...We truly feel that
Intellitech helps us deliver a better product to our
customers..." Jake Haddock CTO Alta Data Technologies We had boards that had ‘passed’
ICT and boundary-scan tests at the CM, but were non-functional.
Intellitech’s innovative multi-processor fault coverage
covered interconnects missed by the CM’s tests. Joe Gagnier, Manager, Unisys
“We’re using Intellitech’s
PT100Pro with FlashJETT in our production to program two different
microcontrollers on four PCBs at a time. It is no longer
business as usual in the auto industry. We must use new
solutions which provide the most value for our budget.
Intellitech’s FlashJETT solution enables us to achieve
production line throughput while simultaneously meeting our cost
objectives” Nagabhushana Shastry SMT Manager Continental
Automotive Components
"We chose Intellitech's PT100 PCB tester because it enables us to program and test many PCB cards concurrently. The PT100 enables us to expand the number of tet channels as our production needs grow, protecting our investment for many years to come. Concurrent test lowers our overall cost of test and FLASH programming when compared to ICT." Marcus Andrade, CEO, VTEC Register for the white paper: New Strategies for cost effective production PCB test and configuration This requires Chinese fonts: |
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