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Boundary Scan ICs and Scan Test Components

TEST-IPTM for 1149.1 test, Flash Programming & FPGA configuration

Boundary Scan begins with easy to use JTAG scan components. The TEST-IP Family is patented infrastructure Intellectual Property which enables design teams to produce high-quality self-testable and in-the-field re-configurable products based on boundary scan 1149.1/JTAG techniques. Plug and play scan components save you design time, reduce BOM costs and add new value added capabilities to your design.

 
systembist test IC

Boundary Scan Test & Flash Programming Tools

Boundary Scan test tools   - Read how the Eclipse boundary scan family fits into your PCB scan test and FLASH programming strategy . All of Intellitech's PCB test tools support ARM CPU emulation test and analog test through GPIB/VISA/PXI instruments as a basic PCB test capability.

  The Eclipse Boundary Scan Test Development Environment is a complete solution for 1149.1 based testing, debug and in-system configuration of complex PCBs and Systems.  Read how Intellitech's exclusive schematic based debug can lower your prototype debug and test development time. Toggle and observe logic values on the pins of your devices simply by pointing and clicking on logic views of your design.

Do you have a small PCB and think you can't afford an investment in quality tools? Do you have less than six JTAG/1149.1 devices? You know Intellitech for high-end 1149.x test, but small PCB versions of Eclipse are more affordable than you think! Register to download evaluation copies and get online price lists.

 

The Boundary Scan Executive is the production test version of Eclipse. Tests that are developed in Eclipse are exported and run the Scan Executive platform. Scan Executive supports singe unit testing or multiple unit testing depending on the pod or tester you are using.

Intellitech has two award winning testers, the PT100 Concurrent JTAG Tester  and PT100Pro Concurrent JTAG Tester that can test multiple PCBs and program FLASH on-board within production cycle times.  Test and Program 16, 32, 64 or more PCBs in order to increase throughput. Concurrent test enables you to add more comprehensive tests (which take longer to execute) without creating production bottlenecks.

Concurrent Boundary Scan (CJTAG) for Burn-in or Production

Need to add JTAG tests to your PCB burn-in? The PT100 Concurrent JTAG Tester is an expandable tester designed to allow testing and programming of large numbers of UUTs currently with full diagnostics.

Concurrent JTAG

 

JTAG test functional test For production test, consider our pre-designed PXI based PT100Pro which combines all analog testing, JTAG/1149.1 and emulation based functional tests with industry standard Everett Charles VG interface. The PT100Pro is the perfect solution for testing boards with a CPU, some 1194.1/JTAG and analog test points.

 

 

 

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September 9th, 2009 "Wireless JTAG BOST approach to lowering production JTAG costs" and “Micropin Vertical fixtures for volume PCB test” to be presented by Intellitech at the Board Test Worksop 2009, September 16 and 17th in Ft. Collins, CO

August 31th, 2009 Interview with customer Jake Haddock, CTO of Alta Data Techologies. JTAG Success

August 26th, 2009 Meet with Intellitech at FPGA Camp at Juniper Networks in Sunnyvale, CA. Invited speaker CJ Clark presents "Validating FPGA SERDES throughout the product lifecycle". FPGA Camp

August 25th, 2009 The benefits of SystemBIST FPGA configuration is highlighted in the article "Managing Multiple Bitstream Images..." by Neil Jacobson in Chip Design.. Bitstreams

August 23rd, 2009 Intellitech's BSDL Syntax Checker is now available for free semantic, grammar and IEEE 1149.x rule checks. Free BSDL Syntax Check

August 17th, 2009 "Intellitech’s CEO, CJ Clark is invited judge for New York University’s Cyber Security Awareness Week, October 12th ” Anti-tamper Awareness

August 10-11, 2009- Meet Intellitech at Command, Control, Computers, Communication, Intelligence, and Information Summit (C4I2), at the Taj Palace, New Delhi, India. C4I2

Prior JTAG News...

Register for the white paper:

New Strategies for cost effective production PCB test and configuration

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并行可编程ICT平台提升板上闪存及

FLASH器件测试效率


“I like the fact that Intellitech has good overall long term vision for IEEE 1149.x based test. They are not just reacting to what I need at the moment....Support has been one of the best I’ve ever encountered from a vendor...We truly feel that Intellitech helps us deliver a better product to our customers..."
Full interview


Jake Haddock
CTO
Alta Data Technologies

We had boards that had ‘passed’ ICT and boundary-scan tests at the CM, but were non-functional.  Intellitech’s innovative multi-processor fault coverage covered interconnects missed by the CM’s tests.
Read More

Joe Gagnier, Manager, Unisys

“We’re using Intellitech’s PT100Pro with FlashJETT in our production to program two different microcontrollers on four  PCBs at a time. It is no longer business as usual in the auto industry.  We must use new solutions which provide the most value for our budget.   Intellitech’s FlashJETT solution enables us to achieve production line throughput while simultaneously meeting our cost objectives”

Nagabhushana Shastry SMT Manager Continental Automotive Components

"We chose Intellitech's PT100 PCB tester because it enables us to program and test many PCB cards concurrently. The PT100 enables us to expand the number of tet channels as our production needs grow, protecting our investment for many years to come. Concurrent test lowers our overall cost of test and FLASH programming when compared to ICT."

Marcus Andrade, CEO, VTEC

"In our market, system cost is an important factor in our customer's decision process. Xalted selected Intellitech's SystemBIST and Concurrent JTAG Architecture in order to lower our FPGA configuration and system test costs."

Robert D. Connolly V.P. Product Engineering, Xalted Networks (India)

More JTAG Success...